PIFOC® Objective & PInano® Sample Scanners for Microscopy

Piezo flexure stages and objective scanners of the PIFOC® and PInano® series offer high dynamics in positioning and scanning tasks. Well adapted solutions for XY specimen positioning parallel and vertical to the optical axis and Z focusing of the objective are available as standard products.

Stages are also available conveniently in a system together with controller and all required connecting cables and software. Like all piezo systems, microscopy stages and scanners are delivered precalibrated with measurement log. 

Buy PI Products Online

Buy PI Products Online

Order PI’s stages, controllers, and matching accessories for your project in our online shop.

PIFOC® Objective Scanners for Microscopy

P-725.xCDE2 PIFOC Focus Scanner for Microscope Objectives

Dynamic Scanning with Travel Ranges of 100 µm, 400 µm, or 800 µm

P-726 PIFOC High-Load Objective Scanner

Highly Dynamic Scanning System with Long Travel Range for Heavy Objectives

V-308 Voice Coil PIFOC Focus Drive for Objectives

High-dynamics positioner for microscope objectives

ND72Z2LAQ PIFOC Objective Scanning System 2000 µm

Nanometer Resolution and Fast Step-and-Settle

P-725.CDD PIFOC High Dynamics Piezo Scanner

Nanopositioner and Scanner for Microscope Objectives

Vertical Sample Stages for Microscopy

P-737 PIFOC Specimen Z Positioner

With Large Aperture and Low Profile

P-736 PInano® Z Microscope Scanner

Inexpensive, with Low Profile

PInano® Piezo Flexure XY(Z) Scanners

P-545.xR8S PInano® XY(Z) Piezo System

Inexpensive Nanopositioning System for High-Resolution Microscopy

P-545.xC8S PInano® Cap XY(Z) Piezo System

Capacitive Position Measuring for Super-Resolution Microscopy

P-545.3D8S PInano® Trak Piezo Tracking System

Fast XY(Z) Stage for High Dynamics Microscopy